We appreciate your interest in Edo Corp part number 390A, which is currently ready for procurement here on Prompt Aerospace. For your reference, part number 390A is listed with the NSN 6625-00-504-1949 and description “Test Set Semiconduc.” If this is the item you are seeking and you would like to request a quote for your comparisons, simply complete the form below with information like your desired quantity, budget, and anticipated fulfillment timeframe. We regularly respond to requests within 15 minutes of receiving them, using the details we are offered to curate the most ideal purchasing options.
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If you want to explore other items produced by Edo Corp under the CAGE Code 00752 or that similarly fall under the FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments, keep in mind that since we list everything with relevant information, you can easily locate related part numbers using our search engine or catalogs. We also excel at tracking down parts with long lead times or that are generally hard to find, meaning that we can serve you even if you do not see exactly what you need on our website. With all of this being said, we are ready to help you source any of the NSN 6625-00-504-1949 parts and Test Set Semiconduc items your operations require, so request a quote today.
| MRC | Criteria | Characteristic |
|---|---|---|
| HGTH | HEIGHT | 3.000 INCHES NOMINAL |
| ANNQ | MATERIAL AND LOCATION | ALUMINUM CARRYING CASE |
| ACYR | DC VOLTAGE RATING | 1.5 VOLTS NOMINAL |
| AQXY | TEST TYPE FOR WHICH DESIGNED | TO MEASURE THE RELATIVE NOISE FIGURE OF MICROWAVE MIXER CRYSTALS,TO OBTAIN AN APPROXIMATE IMPEDANCE CHECK FOR SELECTING MATCHED CRYSTALS,FOR USE IN BALANCE MIXERS,TO MEASURE THE RELATIVE SENSITIVITY OF MICROWAVE DETECTOR CRYSTALS |
| ABGL | WIDTH | 6.000 INCHES NOMINAL |
| ABRY | LENGTH | 6.000 INCHES NOMINAL |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| FEAT | SPECIAL FEATURES | ACCEPTS CERAMIC CARTRIDGE AND COAXIAL TYPES OF BOTH NORMAL AND REVERSED POLARITIES; REMOTE TEST JACK PERMITS TESTING CRYSTALS W/O REMOVING THEM FROM RECEIVER |
| ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
| AQXZ | OPERATING TEST CAPABILITY | SILICON MIXER CRYSTALS,RANGE 0 TO 10000 MC,PORM 1/2 DB ON CONVERSION LOSS,PORM 0.5 DB ON NOISE TEMP |
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