We appreciate your interest in Parker Hannifin Corporation part number 849-046-002-HCI, which is currently ready for procurement here on Prompt Aerospace. For your reference, part number 849-046-002-HCI is listed with the NSN 5961-01-450-8229 and description “Semiconductor Device Diode.” If this is the item you are seeking and you would like to request a quote for your comparisons, simply complete the form below with information like your desired quantity, budget, and anticipated fulfillment timeframe. We regularly respond to requests within 15 minutes of receiving them, using the details we are offered to curate the most ideal purchasing options.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-01-450-8229 Item PartTypeName: SEMICONDUCTOR DEVICE,DIODE | 5961 | 014508229 | 0 | N | A | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | A | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
849-046-002-HCI | 5 | 2 | 1 |
MRC | Criteria | Characteristic |
---|---|---|
CTQN | Voltage Rating In Volts Per Characteristic | 400.0 MAXIMUM REVERSE VOLTAGE, PEAK |
AXGY | Mounting Method | TERMINAL |
CTQX | Current Rating Per Characteristic | 3.00 AMPERES ALL PRIMARIES MAXIMUM AND 5.00 AMPERES FORWARD CURRENT, AVERAGE ABSOLUTE |
TEST | Test Data Document | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). |
AGAV | End Item Identification | FUEL SYSTEM E/I FSCM 76823 |
ABHP | Overall Length | 0.300 INCHES MAXIMUM |
FEAT | Special Features | NUCLEAR HARDNESS CRITICAL PROCESS |
ABBH | Inclosure Material | GLASS |
TTQY | Terminal Type And Quantity | 2 UNINSULATED WIRE LEAD |
ADAV | Overall Diameter | 0.145 INCHES MAXIMUM |
MRC | Decoded Requirement | Clear Text Reply |
CRTL | Criticality Code Justification | FEAT |
CTMZ | Semiconductor Material | SILICON |
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