We appreciate your interest in Solid State Devices Inc part number 717801321-001, which is currently ready for procurement here on Prompt Aerospace. For your reference, part number 717801321-001 is listed with the NSN 5961-01-302-7880 and description “Semiconductor Devices Unitized.” If this is the item you are seeking and you would like to request a quote for your comparisons, simply complete the form below with information like your desired quantity, budget, and anticipated fulfillment timeframe. We regularly respond to requests within 15 minutes of receiving them, using the details we are offered to curate the most ideal purchasing options.
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If you want to explore other items produced by Solid State Devices Inc under the CAGE Code 30043 or that similarly fall under the FSC 5961 Semiconductor Devices and Associated Hardware, keep in mind that since we list everything with relevant information, you can easily locate related part numbers using our search engine or catalogs. We also excel at tracking down parts with long lead times or that are generally hard to find, meaning that we can serve you even if you do not see exactly what you need on our website. With all of this being said, we are ready to help you source any of the NSN 5961-01-302-7880 parts and Semiconductor Devices Unitized items your operations require, so request a quote today.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-302-7880 Item PartTypeName: SEMICONDUCTOR DEVICES,UNITIZED | 5961 | 013027880 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 20655 | 5 | 2 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | CERAMIC |
| ABHP | OVERALL LENGTH | 0.358 INCHES MAXIMUM |
| ABKW | OVERALL HEIGHT | 0.100 INCHES MAXIMUM |
| ABMK | OVERALL WIDTH | 0.358 INCHES MAXIMUM |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE AND 2 TRANSISTOR |
| AXGY | MOUNTING METHOD | PRESS FIT |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL TRANSISTOR |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 0.9 MAXIMUM FORWARD VOLTAGE,DC ALL SEMICONDUCTOR DEVICE DIODE |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 15.0 MAXIMUM DRAIN TO SOURCE VOLTAGE ALL TRANSISTOR |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 100.00 MICROAMPERES MAXIMUM FORWARD CURRENT,DC ALL SEMICONDUCTOR DEVICE DIODE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 175.00 MILLIAMPERES MAXIMUM ZERO-GATE-VOLTAGE DRAIN CURRENT ALL TRANSISTOR |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS JUNCTION |
| FEAT | SPECIAL FEATURES | ALL SEMICONDUCTOR DEVICE DIODE JUNCTION PATTERN ARRANGEMENT: PN |
| TTQY | TERMINAL TYPE AND QUANTITY | 20 UNINSULATED WIRE LEAD |
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